Com-Power Near Field Probes, model PS-400

The Com-Power PS-400 near field probe kit is used find the source of EMI radiation from products that fail EMC compliance testing. Near field probes let you "sniff" around the circuits, cables, and enclosures to find the source.
Article number:
PS-400
Availability:
In stock
Delivery time:
7 - 12 days
€449,00
Excl. tax

The PS-400 is a Near Field Probe set consisting of a tip probe, a broadband probe, a H-field probe and a custom storage case. Performance and ease of use were designed into this product. The unique design allows easy access for tight or hard to reach places while reducing the effect of hand position or cable placement.

The tip probe is a precision E-field probe that features the ability to singularly identify a problem trace or pin. It is designed to be extremely sensitive to distance from the source which allows easy discrimination between traces on a PCB. The unique patented design allows measurement on individual traces as narrow as 3 mils.

The broadband probe is designed to identify E-fields over a broad frequency range. In addition, it has more amplitude sensitivity than the tip probe. Therefore, it offers a quick and efficient diagnosis of an emission source allowing the designer to discover and isolate trouble areas quickly.

The H-field probe's magnetic loop design makes it ideal for isolating sources of magnetic noise. The shielded loop construction allows measurement to minimize the effect of electrical fields.

The PS-400 Near Field Probe set is designed to assist in troubleshooting EMI problems both at the board level and at the component level. It is used to detect radiation from cables, cases, traces and ICs.

Typically the broadband probe is used to locate the general area of emission. Then the tip probe is used to isolate the source to a specific trace or pin. Further analysis can be done by following the noisy trace to find the cause of emissions such as a broken transmission line or impedance mismatch.

A typical use for the H-field probe is to verify the integrity of the chassis of your computer. This is done by moving the probe along the seams of the chassis which may be acting as slot antennas. This probe is also very useful for detecting magnetic noise sources such as large current switching circuits or transformers.

By utilizing these probes, potential certification problems can be discovered and addressed before expensive compliance testing is done. This saves both money and valuable time. The net result is a reduction in testing costs and a decreased time to market.

Near Field Probe Specifications


Probe H-Field Loop E-Field Broadband E-Field Tip
Frequency Range 0.3 - 100 MHz 20 - 1000 MHz 30 - 600 MHz
Dielectric Breakdown 1kV typical 1kV typical 1kV typical
Operating Temp. 0 to 40°C 0 to 40°C 0 to 40°C
Connector Type BNC (f) BNC (f) BNC (f)

Features:

  • Complete Solution: Includes E and H field probes
  • Locate Noise Source: Down to a pin with the fine tip
  • Lightweight: Easy to use and handle
  • Small Size: Allows easy access to corners
  • Sensitive to Tip Position: Ease of pinpointing source
  • Immune to Hand Position: For repeatable results
  • Three Year Warranty
  • Optional preamplifier PAP-501: see related products
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